发明名称 |
SPECTROSCOPIC ANALYSIS METHOD AND APPARATUS OF GAS |
摘要 |
<p>PROBLEM TO BE SOLVED: To enhance measuring accuracy by reducing fringe noise incapable of being cancelled by a method wherein a secondary differential absorption spectrum obtained in a cancel line containing no gas to be measured is substracted from that obtained in a measuring line containing gas to be measured. SOLUTION: In a method for measuring the concn. of a component to be measured in gas to be measured by transmitting semiconductor laser beam modulated in frequency through the gas to be measured to measure a secondary differential spectrum of light absorbing intensity, refined gas to be measured from which a component to be measured is removed is introduced into a sample cell 4, and laser beam from a semiconductor laser 1 is transmitted through this gas to obtain a background spectrum. The gas to be measured is introduced into the sample cell 4 and laser beam is transmitted through this gas to obtain a secondary differential spectrum. A corrected secondary differential spectrum obtained by subtracting the background spectrum from the secondary differential spectrum is used to measure the component to be measured.</p> |
申请公布号 |
JP2000298095(A) |
申请公布日期 |
2000.10.24 |
申请号 |
JP19990107150 |
申请日期 |
1999.04.14 |
申请人 |
NIPPON SANSO CORP |
发明人 |
SUZUKI KATSUMASA;SATO TAKAYUKI |
分类号 |
G01J3/42;G01N21/35;G01N21/3504;(IPC1-7):G01N21/35 |
主分类号 |
G01J3/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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