发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which has a simplified wiring pattern and in which recesses can be formed in a short time by performing etching via etching holes. SOLUTION: A dielectric thin film 12 is formed on the upper surface of a silicon substrate 10, in such a way that the film 12 covers recesses formed on the upper surface of the substrate 10. Then a circuit pattern containing thermoelectric conversion elements 8 is formed on the thin film 12. The upper surface of the substrate 10 becomes the (100)-plane, and first etching holes 16 extended in the <100>-direction of the substrate 10 and second etching holes extending in the <-100>-direction of the substrate 10 are formed through the thin film 12, in a state where the rows of the holes intersect each other in the form of a cross. The first and second etching holes have parallelogram shapes and oblique sides, which are inclined with respect to the <100> and <-100> directions and virtual rectangles passing through the tops of the first and second etching holes are formed continuously. Since the (411)-plane of the substrate 10 appears when the silicon substrate 10 is removed in the cross, the substrate 10 can be etched at the highest rate.
申请公布号 JP2000299303(A) 申请公布日期 2000.10.24
申请号 JP19990108522 申请日期 1999.04.15
申请人 OMRON CORP 发明人 SHIIKI MASAKAZU;SAKURAI KENJI;FUJII MITSURU
分类号 H01L21/306;B81C1/00;G01J1/02;G01P5/12;H01L35/00;(IPC1-7):H01L21/306 主分类号 H01L21/306
代理机构 代理人
主权项
地址