发明名称 |
INTERFACE CHAMBER FOR POD IN CLEAN ROOM |
摘要 |
<p>PROBLEM TO BE SOLVED: To protect a wafer against contamination by providing a unit for circulating the air in an interface chamber and keeping the pressure in the interface chamber higher than that of a surrounding clean room thereby setting the allowable contamination around the clean room at a low level. SOLUTION: An interface chamber 1 is filled with pressurized clean air of class 1-10 and set with a pressure level higher than the air pressure of a surrounding clean room. More specifically, an air outlet 4a as one end of a connection pipe 4 connected with an inner circulation fan 3 for pressurization, and an air inlet 4b as the other end thereof are provided in the interface chamber 1 while penetrating a double wall 1a. A chemical filter 5 and a ULPA(ultra low penetration air) filter 9 are interposed between the inner circulation fan 3 for pressurization and the air outlet 4b and a dry clean air unit 7 is also coupled.</p> |
申请公布号 |
JP2000297953(A) |
申请公布日期 |
2000.10.24 |
申请号 |
JP19990105380 |
申请日期 |
1999.04.13 |
申请人 |
TAIKISHA LTD |
发明人 |
WADA TSUTOMU;MURATA KOICHI |
分类号 |
H01L21/673;F24F7/06;H01L21/68;(IPC1-7):F24F7/06 |
主分类号 |
H01L21/673 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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