| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device testing apparatus capable of conducting highly reliable electrical characteristic tests, having a contact holder for precisely bringing the connecting leads of a semiconductor device into contact with contactors during the electrical characteristic tests. SOLUTION: This testing apparatus for semiconductor devices has the same arrangement as testing apparatuses of the prior art except the arrangement of a contact holder. A contact holder 40 is made from ceramics and has projections 44 arranged in the form of comb teeth with the same pitch as the lead pitch P of leads and each having a connecting lead contact surface 42 as an end surface with a width W equal to or greater than the width Iw of a connecting lead L and smaller than the pitch P of the leads, the number of projections 44 being equal to the number of leads. Since the leads of a semiconductor device are pressed by the projections, even if solder or plating material separated from the leads adhere to and accumulate on the lead contact surface, the leads or contactors are not electrically connected together by the accumulated solder or plating material because the projections are separated from one another. Therefore, highly reliable electrical characteristic tests can be conducted.
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