发明名称 |
METHOD AND DEVICE FOR INSPECTING DEFECT OF COLOR FILTER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and device for inspecting defects of a color filter with a bright image. SOLUTION: A color filter sample 6 with a repeated pattern of colored/ translucent thin film is irradiated with a convergence light which converges on almost one point adjusted by an optical device, and space filters 9 and 12 provided in a plane comprising a point on which the transmission light or reflection light converges selectively allow a part of diffraction image formed with the transmission light or reflection light, so that a defective part is detected by noticing the abnormality of an image acquired by imaging the light which has transmitted through the space filters 9 and 12 with imaging optical means 10 and 13.
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申请公布号 |
JP2000298075(A) |
申请公布日期 |
2000.10.24 |
申请号 |
JP19990106986 |
申请日期 |
1999.04.14 |
申请人 |
SUMITOMO CHEM CO LTD;HITACHI ELECTRONICS ENG CO LTD |
发明人 |
SHIRAGAMI NOBORU;MINOBE MASAO;KOIZUMI MITSUYOSHI;AIKO KENJI;KATO NOBORU |
分类号 |
G01M11/00;G01N21/88;G01N21/958;(IPC1-7):G01M11/00 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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