发明名称 Semiconductor processing methods of forming contacts between electrically conductive materials
摘要 In one aspect, the invention includes a semiconductor processing method of forming a contact between two electrically conductive materials comprising: a) forming a first conductive material over a substrate, the first conductive material being capable of being oxidized in the presence of oxygen to an insulating material; b) sputter cleaning the first conductive material in the presence of oxygen in a gaseous phase and in the presence of an oxygen gettering agent; and c) forming a second conductive material in electrical contact with the first conductive material. In another aspect, the invention includes a semiconductor processing method of forming a contact between two metal layers comprising: a) forming a first metal layer over a substrate; b) forming an oxygen containing material over the substrate proximate the first metal layer and covering at least a portion of the first metal layer; c) forming an opening through the oxygen containing material to the first metal layer; e) after forming the opening and with the substrate in a processing chamber, sputter cleaning the first metal layer and liberating oxygen from the oxygen containing material; f) while sputter cleaning, gettering the liberated oxygen within the processing chamber; and g) forming a second metal layer within the opening and in electrical contact with the first metal layer.
申请公布号 US6136670(A) 申请公布日期 2000.10.24
申请号 US19980146763 申请日期 1998.09.03
申请人 MICRON TECHNOLOGY, INC. 发明人 BLALOCK, GUY T.;HINEMAN, MAX
分类号 H01L21/311;H01L21/3213;H01L21/768;(IPC1-7):H01L21/322;H01L21/44;H01L21/461 主分类号 H01L21/311
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