发明名称 APPEARANCE INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an appearance inspecting device in an inexpensive system constitution for always accurately detecting abnormality of appearance without being affected by shadow due to illumination, regardless of the shape or materials of an object. SOLUTION: Illuminating directions of an object W is switched to plural directions, and object image data, photographed by an image pickup means 1 each time the illuminating direction, are switched are collected. Then, concentration information is compared between the corresponding pixels of the plural object image data whose illuminating directions are different, and the object image data from which the pixels beyond an allowable range are removed are generated by an image processing means 44, and supplied for inspection. Thus, the inspection for the abnormality of appearance based on image without being affected by shadow can be realized.
申请公布号 JP2000298726(A) 申请公布日期 2000.10.24
申请号 JP19990106860 申请日期 1999.04.14
申请人 SHIMADZU CORP 发明人 TOKUOKA NOBUYUKI
分类号 H04N7/18;G01N21/88;G06T1/00;G06T7/00 主分类号 H04N7/18
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