发明名称 ELECTRON BEAM DRAWING APPARATUS AND ELECTRON BEAM BLANKING METHOD
摘要 PROBLEM TO BE SOLVED: To obtain an electron beam drawing apparatus, where an electron beam is capable of reaching to a shutoff stop edge passing through a distance much smaller than a total deflection amplitude at shutoff and deflection of a beam, a time required for shutting off a beam is markedly shortened, and a drawing pattern is improved in resolution. SOLUTION: Blanking deflectors 22 and 23, which shut off or introduce an electron beam that impinges on a drawing material 6, constitute a two-staged deflection system, by which an electron beam is deflected in the same direction. An intermediate plate located between two-staged deflectors is made to serve as a virtual deflection main surface, and a beam shutoff/stop 24 is arranged on this main plane. An opening provided to the stop 24 can be regulated in position by an adjusting mechanism 25. The position of a stop opening is regulated by the adjusting mechanism 25, and an electron beam path opening provided to the stop 24 is positioned adjacent to the position of a beam axis, at which an electron beam is never blocked, and an electron beam is blanked in this state.
申请公布号 JP2000299267(A) 申请公布日期 2000.10.24
申请号 JP19990104912 申请日期 1999.04.13
申请人 JEOL LTD 发明人 ISOBE MORIYUKI
分类号 H01J37/09;G03F7/20;H01J37/147;H01J37/305;H01L21/027;(IPC1-7):H01L21/027 主分类号 H01J37/09
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