| 摘要 |
<p>PROBLEM TO BE SOLVED: To obtain a semiconductor integrated circuit device which can prevent the occurrence of electromigration without reducing the number of mounted unit cells. SOLUTION: In a semiconductor integrated circuit device, a main clock driver 24 is formed in a core area 12 and sub-clock drivers 26 are formed in unused portions of an IQ cell area 14. Then clock supplying main wiring 18 is formed in the upper layer of the core area 12 in parallel with one side of the boundary of the area 12, and clock supplying wiring 22 is formed in such away that one end of the wiring 22 is connected to the main wiring 18 and the other end is extended to the end sections of the unused portions in the IO cell area 14 perpendicularly to the main wiring 18. In addition, the output terminals of the sub-clock drivers 26 are connected to the wiring 22, and the input terminals of the drivers 26 are connected to the output terminal of the main clock driver 24.</p> |
