发明名称 GOVERNOR TESTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a governor testing device, by which connection of an equipment, the analysis of data and the data reduction of a test result can be conducted easily in a short time, labor and a time can be reduced while an error on the reading of a measured data can be lowered and levelling for input conversion is made unnecessary. SOLUTION: A signal (a sensor signal) displaying the information of a generator input to an input section 1a is stored in a memory 1b. The waveform of the signal displaying the information of the generator stored in the memory 1b is indicated on a liquid-crystal panel 1c. An analytic indication is inputted by a key input section 1d, a keyboard 2 and a mouse 3 to the waveform of the signal displaying the information of the generator indicated on the liquid- crystal panel 1c. A CPU 1e analyzes the signal displaying the information of the generator according to the analytic indication inputted by the key input section 1d, the keyboard 2 and the mouse 3, and a governor adjusting the rotational speed of the generator is tested.</p>
申请公布号 JP2000295896(A) 申请公布日期 2000.10.20
申请号 JP19990101243 申请日期 1999.04.08
申请人 TOHOKU ELECTRIC POWER ENGINEERING & CONSTRUCTION CO LTD;KINKEI SYSTEM CORP 发明人 MORI HIDEO;IZAWA SHINICHI;KOBAYASHI HIROSHI;NISHIKAWA EIJI
分类号 H02P9/00;(IPC1-7):H02P9/00 主分类号 H02P9/00
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