发明名称 RESIN-SEALED SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To realize a resin-sealed semiconductor device of a type in which a lower surface of a die pad is exposed from sealing resin and one faces of leads are sealed and which can suppress progressing peel-off between a surface of the die pad and sealing resin, and also to realize a method for manufacturing the semiconductor device. SOLUTION: In the resin-sealed semiconductor device, an annular groove 64 surrounding a central part 2a (support part) upset from a peripheral part 2b by a semi-cut part 11 of a die pad 2 is made in an upper surface of the central part 2a. And a gap between an upper surface of the peripheral part 2b and a rear surface of a semiconductor chip 4 is filled with sealing resin 6. Even when deterioration of a moisture resistance or generation of a thermal stress causes peel-off between the gap filled part 6a and die pad 2, and the peel-off is progressed, the peel-off itself is trapped by the groove 64. Therefore, the progress of the resin peel-off can be stopped and the semiconductor device can be maintained high in its reliability.
申请公布号 JP2000294717(A) 申请公布日期 2000.10.20
申请号 JP19990095185 申请日期 1999.04.01
申请人 MATSUSHITA ELECTRONICS INDUSTRY CORP 发明人 NANO MASANORI;TAKEMURA KUNIKAZU;YAMADA YUICHIRO;ITO FUMITO;MATSUO TAKAHIRO
分类号 H01L23/50;H01L23/12;(IPC1-7):H01L23/50 主分类号 H01L23/50
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