发明名称 |
RESIN-SEALED SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To realize a resin-sealed semiconductor device of a type in which a lower surface of a die pad is exposed from sealing resin and one faces of leads are sealed and which can suppress progressing peel-off between a surface of the die pad and sealing resin, and also to realize a method for manufacturing the semiconductor device. SOLUTION: In the resin-sealed semiconductor device, an annular groove 64 surrounding a central part 2a (support part) upset from a peripheral part 2b by a semi-cut part 11 of a die pad 2 is made in an upper surface of the central part 2a. And a gap between an upper surface of the peripheral part 2b and a rear surface of a semiconductor chip 4 is filled with sealing resin 6. Even when deterioration of a moisture resistance or generation of a thermal stress causes peel-off between the gap filled part 6a and die pad 2, and the peel-off is progressed, the peel-off itself is trapped by the groove 64. Therefore, the progress of the resin peel-off can be stopped and the semiconductor device can be maintained high in its reliability.
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申请公布号 |
JP2000294717(A) |
申请公布日期 |
2000.10.20 |
申请号 |
JP19990095185 |
申请日期 |
1999.04.01 |
申请人 |
MATSUSHITA ELECTRONICS INDUSTRY CORP |
发明人 |
NANO MASANORI;TAKEMURA KUNIKAZU;YAMADA YUICHIRO;ITO FUMITO;MATSUO TAKAHIRO |
分类号 |
H01L23/50;H01L23/12;(IPC1-7):H01L23/50 |
主分类号 |
H01L23/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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