发明名称 TOOL CONDITION MONITORING
摘要 <p>A cutting tool (10) for a machine tool has a substrate (20) and one or more coating layers (12-18) of materials with different Raman spectra, e.g. Tin, TiA1N, TiA1XN (where X = Y, Cr, Nb, W, Mo or the like), AlN, TiC, ZrN, TiZrN, CrN or VN. A Raman spectroscopic probe (22) detects and distinguishes the Raman spectra. As the tool wears, different layers with different Raman spectra are detected, and a warning can be given when the tool needs replacing or recoating.</p>
申请公布号 EP1044351(A1) 申请公布日期 2000.10.18
申请号 EP19990946305 申请日期 1999.09.09
申请人 RENISHAW PLC 发明人 PITT, GILLIES DAVID;MUENZ, WOLF-DIETER
分类号 G01B11/00;B23Q1/00;B23Q17/09;B23Q17/24;G01B11/06;G01B11/24;G01B11/245;G01N21/65;(IPC1-7):G01B11/06;G01N21/84 主分类号 G01B11/00
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