发明名称 Fabrication of a planar MOSFET with raised source/drain by chemical mechanical polishing and nitride replacement
摘要 A method of fabricating a MOSFET includes: depositing an oxide layer on the planarized substrate; forming a silicon nitride island above a gate region in the substrate; building an oxide sidewall about the nitride island; forming a source region and a drain region in the substrate; removing the silicon nitride island, thereby leaving a void over the gate region; forming a gate dielectric over the gate region in the void; filling the void and the areas over the source region and drain region; planarizing the upper surface of the structure by chemical mechanical polishing; depositing a metal layer on the upper surface of the structure; and metallizing the structure to form electrodes in electrical contact with the source region, the gate region, and the drain region.
申请公布号 US6133106(A) 申请公布日期 2000.10.17
申请号 US19980028157 申请日期 1998.02.23
申请人 SHARP LABORATORIES OF AMERICA, INC.;SHARP KABUSHIKI KAISHA 发明人 EVANS, DAVID RUSSELL;HSU, SHENG TENG
分类号 H01L29/78;H01L21/28;H01L21/3105;H01L21/336;H01L21/768;H01L29/417;H01L29/49;H01L29/51;H01L29/786;(IPC1-7):H01L21/336;H01L21/320;H01L21/476 主分类号 H01L29/78
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