| 摘要 |
An integrated circuit device has an analog block connected to a sigma-delta modulator. Analog signals from internal nodes in the analog block are fed to the sigma-delta modulator. The sigma-delta modulator produces digital representations of the analog signals. The digital representations are forwarded to a processor for analysis of the internal node signal. The above structure may be integrated within the framework of existing digital test structures to form a built-in self-test scheme.
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