发明名称 Semiconductor device and process of producing the same
摘要 The present invention provides a polycrystalline silicon conducting structure (e.g., a resistor) whose resistance value is controlled, and can be less variable and less dependent on temperature with respect to any resistant value, and a process of producing the same. Use is made of at least a two-layer structure including a first polycrystalline silicon layer of large crystal grain size and a second polycrystalline silicon layer of small crystal grain size, and the first polycrystalline silicon layer has a positive temperature dependence of resistance while the second polycrystalline layer has a negative temperature dependence of resistance, or vice versa. Moreover, the polycrystalline silicon layer of large grain size can be formed by high dose ion implantation and annealing, or by depositing the layers by chemical vapor deposition at different temperatures so as to form large-grain and small-grain layers.
申请公布号 US6133094(A) 申请公布日期 2000.10.17
申请号 US19980123405 申请日期 1998.07.28
申请人 HITACHI LTD;HITACHI DEVICE ENGINEERING CO. 发明人 SHIMAMOTO, HIROMI;UCHINO, TAKASHI;SHIBA, TAKEO;OHNISHI, KAZUHIRO;TAMAKI, YOICHI;KOBAYASHI, TAKASHI;KIKUCHI, TOSHIYUKI;IKEDA, TAKAHIDE
分类号 H01C7/06;H01L21/02;H01L21/822;H01L27/04;H01L27/06;(IPC1-7):H01L21/336 主分类号 H01C7/06
代理机构 代理人
主权项
地址