发明名称 Semiconductor device with diagonal capacitor bit line and fabrication method thereof
摘要 A semiconductor device includes a semiconductor substrate having an active area including first and second impurity regions of a transistor, a gate formed over the active area of the semiconductor substrate and isolated from the semiconductor substrate, a first insulating interlayer formed on the semiconductor substrate and having first and second contact holes exposing the first and the second impurity regions, respectively, a capacitor having a storage electrode and a plate electrode, the storage electrode being connected electrically to the first impurity region through the first contact hole, a bit line contact pad connected electrically to the second impurity region through the second contact hole, a second insulating interlayer formed on the plate electrode and having a third contact hole exposing the bit line contact pad, and a bit line formed on the second insulating interlayer and in contact with the bit line contact pad through the third contact hole.
申请公布号 US6133598(A) 申请公布日期 2000.10.17
申请号 US19980084982 申请日期 1998.05.28
申请人 LG SEMICON CO., LTD. 发明人 LEE, CHANG-JAE;PARK, NAE-HAK
分类号 H01L27/108;H01L21/8242;(IPC1-7):H01L27/108 主分类号 H01L27/108
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