发明名称 |
METHOD FOR MANUFACTURING METAL OXIDE SEMICONDUCTOR TRANSISTOR |
摘要 |
PURPOSE: A method for manufacturing a metal oxide semiconductor(MOS) transistor is provided to increase an integration degree and to reduce a parasitic current by forming a shallow trench in a simple process. CONSTITUTION: A method for manufacturing a metal oxide semiconductor(MOS) transistor comprises the steps of: sequentially evaporating a gate oxidation layer and a polysilicon layer on a semiconductor substrate(11) having a device region or on a well, forming a gate electrode(13) by a photolithography process; forming a source/drain region in the semiconductor substrate or in the device region of the well by using the gate electrode as a mask; forming an oxidation layer on the semiconductor substrate having the gate electrode and the source/drain region or on the well; eliminating the oxidation layer excluding only the oxidation layer on the sidewall of the gate electrode; and performing a selective epitaxial process on the device region to grow a silicon epitaxial layer on the gate electrode and source/drain region.
|
申请公布号 |
KR20000061331(A) |
申请公布日期 |
2000.10.16 |
申请号 |
KR19990010291 |
申请日期 |
1999.03.25 |
申请人 |
ANAM SEMICONDUCTOR., LTD. |
发明人 |
KIM, HONG SEUP |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|