发明名称 METHOD FOR MANUFACTURING METAL OXIDE SEMICONDUCTOR TRANSISTOR
摘要 PURPOSE: A method for manufacturing a metal oxide semiconductor(MOS) transistor is provided to increase an integration degree and to reduce a parasitic current by forming a shallow trench in a simple process. CONSTITUTION: A method for manufacturing a metal oxide semiconductor(MOS) transistor comprises the steps of: sequentially evaporating a gate oxidation layer and a polysilicon layer on a semiconductor substrate(11) having a device region or on a well, forming a gate electrode(13) by a photolithography process; forming a source/drain region in the semiconductor substrate or in the device region of the well by using the gate electrode as a mask; forming an oxidation layer on the semiconductor substrate having the gate electrode and the source/drain region or on the well; eliminating the oxidation layer excluding only the oxidation layer on the sidewall of the gate electrode; and performing a selective epitaxial process on the device region to grow a silicon epitaxial layer on the gate electrode and source/drain region.
申请公布号 KR20000061331(A) 申请公布日期 2000.10.16
申请号 KR19990010291 申请日期 1999.03.25
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 KIM, HONG SEUP
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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