发明名称 |
METHOD FOR MANUFACTURING METAL OXIDE SEMICONDUCTOR TRANSISTOR |
摘要 |
PURPOSE: A method for manufacturing a metal oxide semiconductor(MOS) transistor is provided to re-oxidize a gate by using oxygen or vapor and nitrogen mixture gas while preventing titanium silicide from diffusing to polysilicon. CONSTITUTION: A method for manufacturing a metal oxide semiconductor(MOS) transistor comprises a process for forming a MOS transistor by sequentially evaporating and patterning a silicide layer in order to decrease resistance of a gate and a diffusion blocking layer on a polysilicon gate. In the method, tungsten silicide is used as the diffusion blocking layer and the silicide layer for reducing the gate resistance is made from titanium silicide. After forming a gate electrode, the tungsten silicide, titanium silicide and side surface of the polysilicon gate are re-oxidized by using oxygen or vapor and nitrogen mixture gas.
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申请公布号 |
KR20000061321(A) |
申请公布日期 |
2000.10.16 |
申请号 |
KR19990010278 |
申请日期 |
1999.03.25 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
EOM, DAE JIN;LEE, SANG DON |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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