发明名称 METHOD FOR MANUFACTURING METAL OXIDE SEMICONDUCTOR TRANSISTOR
摘要 PURPOSE: A method for manufacturing a metal oxide semiconductor(MOS) transistor is provided to re-oxidize a gate by using oxygen or vapor and nitrogen mixture gas while preventing titanium silicide from diffusing to polysilicon. CONSTITUTION: A method for manufacturing a metal oxide semiconductor(MOS) transistor comprises a process for forming a MOS transistor by sequentially evaporating and patterning a silicide layer in order to decrease resistance of a gate and a diffusion blocking layer on a polysilicon gate. In the method, tungsten silicide is used as the diffusion blocking layer and the silicide layer for reducing the gate resistance is made from titanium silicide. After forming a gate electrode, the tungsten silicide, titanium silicide and side surface of the polysilicon gate are re-oxidized by using oxygen or vapor and nitrogen mixture gas.
申请公布号 KR20000061321(A) 申请公布日期 2000.10.16
申请号 KR19990010278 申请日期 1999.03.25
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 EOM, DAE JIN;LEE, SANG DON
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址