发明名称 ORGANIC IRREGULAR REFLECTION PREVENTING POLYMER AND PROCESS FOR PREPARATION THEREOF
摘要 PURPOSE: Novel organic compound capable of being used as a reflection preventive film in the process of forming a microfine pattern using 193 nm ArF and 248 nm KrF in the process of manufacturing a semiconductor device and process for producing the same are provided which can prevent reflection of a lower film layer and remove standing waves. CONSTITUTION: An irregular reflection preventing composition containing an irregular reflection preventing polymer, irregular reflection preventing film using the same and process for producing the same are described. By using the polymer as a reflection preventing film in the process of forming a microfine pattern in the process of manufacturing a semiconductor device, standing waves by change of optical property of a lower film layer on a wafer and the thickness of photoresist, reflective notching and the change of critical dimension(CD) caused by a lower film can be removed such that stable microfine pattern of 64M, 256M, 1G, 4G, 16G and 16DRAM can be formed.
申请公布号 KR20000060410(A) 申请公布日期 2000.10.16
申请号 KR19990008668 申请日期 1999.03.15
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 BAEK, GI HO;JUNG, MIN HO;HONG, SEONG EUN
分类号 C07C67/14;C07C69/00;C07C69/54;C07C69/657;C08F12/32;C08F18/16;C08F20/12;C08F20/14;C08F220/14;C08F220/18;C08F220/26;C08F220/28;C08F220/30;C08F220/32;C09D5/32;C09D5/33;C09D133/06;C09D133/14;C09K;G03C5/00;G03F7/00;G03F7/004;G03F7/11;H01L;H01L21/027;H01L21/31;H01L21/312;H01L21/314;H01L21/469;H01L23/29;(IPC1-7):C07C69/54 主分类号 C07C67/14
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