发明名称 |
ORGANIC IRREGULAR REFLECTION PREVENTING POLYMER AND PROCESS FOR PREPARATION THEREOF |
摘要 |
PURPOSE: Novel organic compound capable of being used as a reflection preventive film in the process of forming a microfine pattern using 193 nm ArF and 248 nm KrF in the process of manufacturing a semiconductor device and process for producing the same are provided which can prevent reflection of a lower film layer and remove standing waves. CONSTITUTION: An irregular reflection preventing composition containing an irregular reflection preventing polymer, irregular reflection preventing film using the same and process for producing the same are described. By using the polymer as a reflection preventing film in the process of forming a microfine pattern in the process of manufacturing a semiconductor device, standing waves by change of optical property of a lower film layer on a wafer and the thickness of photoresist, reflective notching and the change of critical dimension(CD) caused by a lower film can be removed such that stable microfine pattern of 64M, 256M, 1G, 4G, 16G and 16DRAM can be formed.
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申请公布号 |
KR20000060410(A) |
申请公布日期 |
2000.10.16 |
申请号 |
KR19990008668 |
申请日期 |
1999.03.15 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD |
发明人 |
BAEK, GI HO;JUNG, MIN HO;HONG, SEONG EUN |
分类号 |
C07C67/14;C07C69/00;C07C69/54;C07C69/657;C08F12/32;C08F18/16;C08F20/12;C08F20/14;C08F220/14;C08F220/18;C08F220/26;C08F220/28;C08F220/30;C08F220/32;C09D5/32;C09D5/33;C09D133/06;C09D133/14;C09K;G03C5/00;G03F7/00;G03F7/004;G03F7/11;H01L;H01L21/027;H01L21/31;H01L21/312;H01L21/314;H01L21/469;H01L23/29;(IPC1-7):C07C69/54 |
主分类号 |
C07C67/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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