| 摘要 |
PURPOSE: An apparatus for testing a durability of an electronic wave using an optical communication system is provided for accurately monitoring a changed state of all sensors and actuators without any effect from an electronic wave and quickly checking an error and reason of a part due to an electronic wave. CONSTITUTION: A first optical communication exclusive board(16) and a second optical communication exclusive board(18) include a transmission photo coupler(161) and a receiving photo coupler(181) for converting electrical data and light form data. The second optical communication exclusive board(18) includes a serial/parallel interface(182) for converting the electrically converted data into parallel or serial form. The power unit supplies a power, and a test object is driven by a test drive loading box. An electric wave is generated by the electric wave generator. |
