发明名称 INTEGRATE CIRCUIT DEVICE HAVING BUFFER LAYER CONTAINING METAL OXIDE STABILIZED BY LOW TEMPERATURE TREATMENT AND FABRICATING METHOD THEREOF
摘要 PURPOSE: IC circuit is provided to have a buffering layer made of a metal oxide layer which are stabilized by a low-temperature processing, and reduces a leakage current as well as improving a polarization characteristic of a capacitor. CONSTITUTION: A first metal layer pattern is formed on a semiconductor substrate(100), and is insulated from the substrate. A high dielectric layer pattern is formed on the first metal layer pattern. The second metal layer pattern is formed on the high dielectric layer pattern. A buffering layer(122) is formed on the first metal layer pattern, the high dielectric layer pattern and the second metal layer pattern by an atom layer deposition method, and is stabilized by a low-temperature processing below 600°C. An insulating layer is formed on the buffering layer.
申请公布号 KR100269306(B1) 申请公布日期 2000.10.16
申请号 KR19970036558 申请日期 1997.07.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, IN SEON;KIM, YEONG KWAN;LEE, SAN GIN;KIM, BYUNG HEE;LEE, SANG MIN;PARK, CHANG SOO
分类号 H01L21/8247;H01L21/02;H01L21/285;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792;(IPC1-7):H01L27/10 主分类号 H01L21/8247
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