发明名称 METHOD FOR MANUFACTURING CHARGE STORAGE ELECTRODE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for making a charge storage electrode of a semiconductor device is provided to enhance a charge storage capacitance by injecting a phosphor when depositing a polysilicon thin film layer for a charge storage electrode. CONSTITUTION: A field oxide layer, a word line(3), a bit line(4), a source/drain area are formed on a silicon substrate(1). IPO(Inter-Poly-Oxide) layer(6) is deposited on the resultant layer. A predetermined part of the IPO layer(6) is etched to form a contact for a charge storage electrode. A first polysilicon thin film(7) is deposited on the contact. A second amorphous silicon thin film(8) is deposited on the first polysilicon thin film(7). A hemispherical third silicon thin film(9) is deposited on the second amorphous silicon thin film(8). A total structure is annealed to form a hemispherical fourth silicon thin film.
申请公布号 KR100268124(B1) 申请公布日期 2000.10.16
申请号 KR19920027078 申请日期 1992.12.31
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 WOO, SANG-HO;JUN, HA-EUNG;LEE, HYUN-WOO
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
代理机构 代理人
主权项
地址