发明名称 |
METHOD FOR MANUFACTURING CHARGE STORAGE ELECTRODE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for making a charge storage electrode of a semiconductor device is provided to enhance a charge storage capacitance by injecting a phosphor when depositing a polysilicon thin film layer for a charge storage electrode. CONSTITUTION: A field oxide layer, a word line(3), a bit line(4), a source/drain area are formed on a silicon substrate(1). IPO(Inter-Poly-Oxide) layer(6) is deposited on the resultant layer. A predetermined part of the IPO layer(6) is etched to form a contact for a charge storage electrode. A first polysilicon thin film(7) is deposited on the contact. A second amorphous silicon thin film(8) is deposited on the first polysilicon thin film(7). A hemispherical third silicon thin film(9) is deposited on the second amorphous silicon thin film(8). A total structure is annealed to form a hemispherical fourth silicon thin film.
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申请公布号 |
KR100268124(B1) |
申请公布日期 |
2000.10.16 |
申请号 |
KR19920027078 |
申请日期 |
1992.12.31 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
WOO, SANG-HO;JUN, HA-EUNG;LEE, HYUN-WOO |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
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