发明名称 |
METHOD FOR MANUFACTURING CONTACT HOLE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a contact hole of a semiconductor device is provided to improve a reliability by preventing a substrate from being damaged by forming the contact hole. CONSTITUTION: A method for manufacturing a contact hole of a semiconductor device comprises the steps of: forming a first insulating layer(22) on a semiconductor substrate(21) having a transistor; forming a second insulating layer(23) having an etching selectivity ratio different from that of the first insulating layer, on the first insulating layer; forming a third insulating layer(24) having an etching selectivity ration from different that of the second insulating layer to form the contact hole(26), on the second insulating layer; etching the third insulating layer by a selective etchant of the third and second insulating layers, using a mask; and etching the first insulating layer by a wet etching process.
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申请公布号 |
KR20000059993(A) |
申请公布日期 |
2000.10.16 |
申请号 |
KR19990007967 |
申请日期 |
1999.03.10 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
KIM, TAE HUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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