发明名称 METHOD FOR MANUFACTURING CONTACT HOLE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a contact hole of a semiconductor device is provided to improve a reliability by preventing a substrate from being damaged by forming the contact hole. CONSTITUTION: A method for manufacturing a contact hole of a semiconductor device comprises the steps of: forming a first insulating layer(22) on a semiconductor substrate(21) having a transistor; forming a second insulating layer(23) having an etching selectivity ratio different from that of the first insulating layer, on the first insulating layer; forming a third insulating layer(24) having an etching selectivity ration from different that of the second insulating layer to form the contact hole(26), on the second insulating layer; etching the third insulating layer by a selective etchant of the third and second insulating layers, using a mask; and etching the first insulating layer by a wet etching process.
申请公布号 KR20000059993(A) 申请公布日期 2000.10.16
申请号 KR19990007967 申请日期 1999.03.10
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 KIM, TAE HUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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