发明名称 SILICON ON INSULATOR TRANSISTOR AND FABRICATION METHOD THEREOF
摘要 PURPOSE: A silicon on insulator transistor and a fabrication method thereof are provided to reduce parasitic junction capacitor. CONSTITUTION: A silicon on insulator(SOI) transistor includes a gate oxide(27) on an SOI layer(25) and a gate electrode(29) on the gate oxide(27). The SOI layer(25) is isolated from a handle wafer(21) of a first conductive type by an oxide layer(23). A source region(33a,33b) and a drain region(35a,35b) are respectively formed in the SOI layer(25) around the gate electrode(29), and a spacer(31) is formed on both sides of the gate electrode(29). Additionally, an isolation layer(37) is formed to define an active region therebetween. In particular, an air gap(39) or a dielectric layer having low dielectric constant is formed underneath the source region(33a,33b) and the drain region(35a,35b), reducing parasitic junction capacitor.
申请公布号 KR20000061459(A) 申请公布日期 2000.10.16
申请号 KR19990010508 申请日期 1999.03.26
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 KIM, IL GWON;LEE, SEUNG U
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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