发明名称 X-RAY EXAMINATION APPARATUS WITH A BRIGHTNESS CONTROL SYSTEM
摘要 An X-ray examination apparatus includes an X-ray source with a brightness control signal input, an X-ray image device for providing an X-ray image of an object to be imaged, X-ray absorption means between the X-ray source and the X-ray image device, a brightness control system coupled to the X-ray image device and the brightness control signal input in order to derive a brightness control signal from the X-ray image, and a detection means which is coupled between the X-ray image device and the brightness control signal input in order to exclude a degree of detected absorption from said brightness control signal caused by the absorption means present in the X-ray image. Direct radiation and absorption means (such as filters) in the detected absorption range in a histogram of pixels of the X-ray image are automatically excluded from the brightness control which is thus improved.
申请公布号 WO0060908(A1) 申请公布日期 2000.10.12
申请号 WO2000EP02595 申请日期 2000.03.22
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 VAN BERKEL, ARNOLDUS, P., L.
分类号 G21K3/00;A61B6/00;G01T1/00;G21K5/00;G21K5/02;H05G1/36;H05G1/64;(IPC1-7):H05G1/36 主分类号 G21K3/00
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