发明名称 |
A INSPECTING DEVICE OF SOLDERING AND METHOD TO BE COMPATIBLE |
摘要 |
PURPOSE: An apparatus for examining a solder and a proper method thereof are provided to improve an exact detection of whether a solder examining apparatus is defective or not. CONSTITUTION: The first illumination lamp(1) emits a solder fillet(F) on the same axis with a camera(53). The second illumination lamp(2) is installed to have a different radiation angle from that of the first illumination lamp(1) and obtains an image which is inversed from an image obtained by the first illumination lamp(1). A vision apparatus(3) synthesizes the image signals of the first illumination lamp(1) and the second illumination lamp(2) and outputs the formed condition of the solder fillet(F) to a monitor(55) as well as judging whether the solder fillet condition is good or not. In a state that the first illumination lamp(1) is turned on and the second illumination lamp(2) is turned off, the first image is obtained. In a state that the first illumination lamp(1) is turned off and the second illumination lamp(2) is turned on, the second image is obtained.
|
申请公布号 |
KR100269448(B1) |
申请公布日期 |
2000.10.16 |
申请号 |
KR19970059095 |
申请日期 |
1997.11.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JAE SUN |
分类号 |
H05K3/34;(IPC1-7):H05K3/34 |
主分类号 |
H05K3/34 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|