发明名称 |
TRENCH FORMING METHOD, ELEMENT ISOLATION METHOD USING THE TRENCH AND MANUFACTURINGG METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a trench, a method for dividing devices and a method for fabricating a semiconductor device thereby are provided to control the depth of the trench easily by adjusting the depth of an oxide layer, which is used as an etching stop layer in a trench etching process, in the semiconductor substrate. CONSTITUTION: An oxide film(22) is formed on a semiconductor substrate(100) by a predetermined depth. A photoresist is deposited on the semiconductor substrate(100), exposed by using a mask, and developed, so that a mask pattern is formed. The semiconductor substrate(100) is etched by using the oxide film(22) as an etching stop layer and applying the mask pattern, so that a trench(15) is formed. Then, the mask pattern is removed.
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申请公布号 |
KR100269276(B1) |
申请公布日期 |
2000.10.16 |
申请号 |
KR19920017437 |
申请日期 |
1992.09.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON, DONG-JIN;PARK, JIN-SUNG;LEE, WOO-SUNG;LEE, BYUNG-HOON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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