发明名称 TRENCH FORMING METHOD, ELEMENT ISOLATION METHOD USING THE TRENCH AND MANUFACTURINGG METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a trench, a method for dividing devices and a method for fabricating a semiconductor device thereby are provided to control the depth of the trench easily by adjusting the depth of an oxide layer, which is used as an etching stop layer in a trench etching process, in the semiconductor substrate. CONSTITUTION: An oxide film(22) is formed on a semiconductor substrate(100) by a predetermined depth. A photoresist is deposited on the semiconductor substrate(100), exposed by using a mask, and developed, so that a mask pattern is formed. The semiconductor substrate(100) is etched by using the oxide film(22) as an etching stop layer and applying the mask pattern, so that a trench(15) is formed. Then, the mask pattern is removed.
申请公布号 KR100269276(B1) 申请公布日期 2000.10.16
申请号 KR19920017437 申请日期 1992.09.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON, DONG-JIN;PARK, JIN-SUNG;LEE, WOO-SUNG;LEE, BYUNG-HOON
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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