发明名称 Cleaner for inspecting projections, and inspection apparatus and method for integrated circuits
摘要 A cleaner of this invention is a cleaner for inspecting projections and removes any substance, e.g., aluminum oxide, which attaches to needle points of probe needles, when the probe needles pierce into the cleaner. The cleaner has a cleaner layer and a substrate. The cleaner layer is constituted by an elastic material layer, and a filler having a surface state improving function of the inspecting projections and dispersed in the elastic material layer. As the filler having a surface state improving function, a powder including at least one of ceramic materials, e.g., sand, glass, alumina, Carborundum (trade name), and the like, or a fiber layer made of an inorganic fiber or organic fiber can be employed.
申请公布号 US6130104(A) 申请公布日期 2000.10.10
申请号 US19980055291 申请日期 1998.04.06
申请人 TOKYO ELECTRON LIMITED 发明人 YAMASAKA, RIKIHITO
分类号 G01R31/316;(IPC1-7):G01R31/26 主分类号 G01R31/316
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