发明名称 METHOD FOR CONTROLLING MODE AND ULTRASONIC WAVE DIAGNOSTIC DEVICE
摘要 PROBLEM TO BE SOLVED: To easily discover a small part to be concerned in a screening mode and to obtain high resolution in a minute inspection mode. SOLUTION: In the screening mode, focus points concerning an ultrasonic wave beam thickness direction are comparatively reduced, a frame rate is comparatively heightened and also the thickness is comparatively increased (H2 and H3). In the minute inspection mode, the focus points are comparatively increased, the frame rate is comparatively lowered and the thickness is comparatively reduced (H4 and H5). Thus, even a small tumor or the like can be discovered in the case of screening and also plotted with high resolution in the case of a minute inspection.
申请公布号 JP2000279410(A) 申请公布日期 2000.10.10
申请号 JP19990093283 申请日期 1999.03.31
申请人 GE YOKOGAWA MEDICAL SYSTEMS LTD 发明人 HASHIMOTO HIROSHI
分类号 A61B8/00;G01B17/00;G01B17/06;H04R17/00;(IPC1-7):A61B8/00 主分类号 A61B8/00
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