System and method for testing of embedded processor

摘要

An interlocutor system and method is described that allows for at-speed testing of an embedded microcontroller at the control of an embedded digital signal processor in a system-on-a-chip architecture. The interlocutor system includes a buffer for temporarily storing test program data words output by the DSP and retrieved by the microcontroller being tested and a control circuit for controlling the microcontroller and DSP. The microcontroller, DSP, and interlocutor system are all located on a single integrated circuit.