发明名称 ELECTROSTATIC CHUCK
摘要 <p>PROBLEM TO BE SOLVED: To reinforce a chuck force by a method wherein a shielding material layer intervenes between chuck electrode layers of different poles disposed adjacently in a direction of an insulating substrate face. SOLUTION: An insulating substrate 2 constituting an electrostatic chuck 1 is composed of an aluminum nitride sintered compact of a dielectric. Since the insulating substrate 2 chucks simultaneously a plurality of silicon wafers W1 as matters to be attracted, it is formed so as to have an area several times that of the silicon wafer W1. As a degree of flatness of a chuck face S1 increases, namely a surface roughness decreases, a Johnson-Rahbeck power increases. The insulating substrate 2 has a multilayer structure, and is formed internally with chuck electrode layers 3, 4, and a heater electrode layer. The chuck electrode layer 3 of a positive pole and the chuck electrode layer 4 of a negative pole are together positioned in a layer close to the chuck face S1. A shielding material layer 6 intervenes between straight line parts 3a, 4a of the chuck electrodes 3, 4 of invert poles. Thus, in order to attain a predetermined chuck force, even if a large DC voltage is applied, the electrostatic chuck 1 does not lead to dielectric breakdown.</p>
申请公布号 JP2000277595(A) 申请公布日期 2000.10.06
申请号 JP19990081183 申请日期 1999.03.25
申请人 IBIDEN CO LTD 发明人 ITO ATSUSHI;ITO YASUTAKA
分类号 B23Q3/15;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 主分类号 B23Q3/15
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