| 摘要 |
PROBLEM TO BE SOLVED: To prevent the time required for carrying out boundary scan tests from becoming longer due to an excessive boundary scan register when a semiconductor integrated circuit containing a boundary scan test device is assembled in a package having a small number of pins. SOLUTION: When a prescribed boundary scan registers 111 and 112 having no connected external input-output pin exist in a package in which a semiconductor integrated circuit is assembled, a switch 20 for by-passing the registers 111 and 112 in accordance with a by-pass control signal impressed upon a by- pass control signal input terminal 5 is provided. |
