发明名称 ELECTRO-OPTICAL SAMPLING PROBER
摘要 PROBLEM TO BE SOLVED: To prevent noise from being transmitted to a photo-diode and improve measuring accuracy by holding the photo-diode from a body frame side through an insulating body. SOLUTION: A PD(photo-diode) fitting part 47 is provided with a PD stage fitting plate 52 fitted to a X-axis stage 45, a lens 53 fitted to the PD stage fitting plate 52, and a PD holder 54 for fitting a photo-diode 48 to the position corresponding to the lens 53. The PD stage fitting plate 52 is a member of U-shaped section, and it is formed so as to be fitted with the lens 53. The PD stage fitting plate 52 and the PD holder 54 are formed out of ceramics as an insulating body. Hereby, it is prevented the change of the electromagnetic field in an IC wafer, or the change of the electromagnetic field around an elecro- optical sampling probe is transmitted to the photo-diode 48 to be detected as noise.
申请公布号 JP2000275277(A) 申请公布日期 2000.10.06
申请号 JP19990080543 申请日期 1999.03.24
申请人 ANDO ELECTRIC CO LTD;NIPPON TELEGR & TELEPH CORP <NTT> 发明人 AKIKUNI FUMIO;OTA KATSUSHI;NAGATSUMA TADAO;SHINAGAWA MITSURU;YAMADA JUNZO
分类号 G01R13/34;G01R1/07;(IPC1-7):G01R13/34 主分类号 G01R13/34
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