发明名称 MANUFACTURE OF SEMICONDUCTOR STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor storage device which can improve the breakdown voltage of a flash memory by selective epitaxial growth. SOLUTION: This manufacturing method of a semiconductor storage device forms a flash memory hybrid logic LSI in one wafer. A process masking a logic LSI part 1A with a resist 9 and eliminating a protective oxide film 4 of a flash memory 1B, a process using the protective oxide film 4 as a mask and epitaxially growing a thick silicon film 7 on a SOI body 3, and a process eliminating the protective oxide film 4 are performed in this order.
申请公布号 JP2000277707(A) 申请公布日期 2000.10.06
申请号 JP19990084017 申请日期 1999.03.26
申请人 OKI ELECTRIC IND CO LTD 发明人 SATO YASUSHI;KOBAYASHI YASUTAKA;KAWAZU YOSHIYUKI
分类号 H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/10;H01L21/824 主分类号 H01L21/8247
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