发明名称 |
MANUFACTURE OF SEMICONDUCTOR STORAGE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor storage device which can improve the breakdown voltage of a flash memory by selective epitaxial growth. SOLUTION: This manufacturing method of a semiconductor storage device forms a flash memory hybrid logic LSI in one wafer. A process masking a logic LSI part 1A with a resist 9 and eliminating a protective oxide film 4 of a flash memory 1B, a process using the protective oxide film 4 as a mask and epitaxially growing a thick silicon film 7 on a SOI body 3, and a process eliminating the protective oxide film 4 are performed in this order.
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申请公布号 |
JP2000277707(A) |
申请公布日期 |
2000.10.06 |
申请号 |
JP19990084017 |
申请日期 |
1999.03.26 |
申请人 |
OKI ELECTRIC IND CO LTD |
发明人 |
SATO YASUSHI;KOBAYASHI YASUTAKA;KAWAZU YOSHIYUKI |
分类号 |
H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/10;H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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