| 摘要 |
PROBLEM TO BE SOLVED: To make efficiently performable machining and inspection of the amount of depth in a time film magnetic head. SOLUTION: A second MR element 22 of a plurality of test patterns TEG is provided with the same material, film thickness and track width Tw as those of a first MR element in a thin film magnetic head with the height h formed differently depending on each test pattern TEG. Then, a sense electric current is applied to each of the plurality of test patterns TEG, the resistance values are measured for the second MR elements 22 of different heights h, and a correlation function between these resistance values and the heights h is determined. Then, at the time of or after the machining of the slider face of the thin film magnetic head, a sense current is applied to the first MR element and the resistance value is measured. The amount of depth of the thin film magnetic head is determined by substituting this resistance value into the correlation function.
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