发明名称 METHOD FOR FORMATION OF RESIST MASK FOR DRY ETCHING
摘要 <p>PROBLEM TO BE SOLVED: To form a good resist mask by an easy method which protects electrodes against dry etching of a buffer layer. SOLUTION: After an electrode 6 is formed, a dry etching resist 7 is directly applied thereon without peeling a plating resist 5, exposed by using an exposure mask 8 in which a pattern of larger width than the electrode width is formed, and developed. Then the plating resist 5 is peeled and the layers are subjected to dry etching. As for the resist used for the plating resist 5 and for the dry etching resist 7, resist materials showing opposite negative-positive photosensitive characteristics to each other are used.</p>
申请公布号 JP2000275591(A) 申请公布日期 2000.10.06
申请号 JP19990082313 申请日期 1999.03.25
申请人 NGK INSULATORS LTD 发明人 FUWA TORU;TOYODA SHUHEI
分类号 H01L21/302;G02F1/035;H01L21/3065;(IPC1-7):G02F1/035;H01L21/306 主分类号 H01L21/302
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