SYSTEM AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To obtain a testing system which can make an input-output terminal to be shared in common without making the length of test data longer in a semiconductor integrated circuit having a plurality of scan chains. SOLUTION: Test data are supplied to terminals 13-15 exclusively used for tests by adding the cyclic redundant codes(CRC) of the data to the ends of the data. Then a CRC data signal decoding circuit 10 for the outputs of scan chains 21-23 decodes the cyclic redundant codes and outputs the decoded results to the terminals 13-15 through a bidirectional buffer circuit 20.