High resolution equipment for observing eye or manufactured goods, comprises means to measure wave front deformation and using measurement to compensate light coming from illuminated sites

摘要

The eye (5) is illuminated by a light emitting diode (12) and the light returning from the illuminated site (01) passes through lenses (500) and mirrors (400,450) to a detector (700) connected to a processor and display unit (42). A correction is applied by a correction module (20) using data from a wave front analyzer (21) which receives light from a super emitting diode (11) via a separating mirror (SM1).