发明名称 PATTERNING METHOD
摘要 PROBLEM TO BE SOLVED: To etch selectively a chemically stable carbon film, by providing on a substrate a film having carbon as its main component, and by providing on this film a mask film having a blocking action against an ionized oxygenation-substance gas except for an uncovered region with this mask, and further, by removing therfrom the carbon film present in the uncovered region through the etching by the oxygenation-substance gas made into a plasma. SOLUTION: On a silicon substrate 31, the opening having therein the insulation film of a silicon oxide film 37 is provided to pattern thereon an electric wiring 32 made of the superconductive material of aluminum oxide, silicon oxide or silver oxide. Thereafter, there is provided a blocking layer 33 whereby the electric wiring 32 is not oxidized to change it into an insulator even when exposing it to the plasma atmosphere of an oxygenation-substance gas, and further, thereon a carbon film 34 is formed. A mask is provided on the portion other than the region wherefrom its carbon film 34 is removed by etching it in the plasma atmosphere of the oxygenation-substance gas. Then, a photoresist is provided on this mask. By using as a mask 35 the photoresist or a silicon oxide, the carbon film 34 is removed from an opening 36 present below the mask 35. By introducing a fluorination-sustance gas, a blocking layer 33' and the mask 35 present in the opening 36 are removed therefrom.
申请公布号 JP2000277499(A) 申请公布日期 2000.10.06
申请号 JP20000058163 申请日期 2000.03.03
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI
分类号 H01L21/302;H01L21/205;H01L21/3065;H01L21/31;H01L21/314;(IPC1-7):H01L21/306 主分类号 H01L21/302
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