发明名称 METHOD FOR CALIBRATING MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To realize highly accurate measurement by calculating a correcting value for calibration based on arbitrary known frequency characteristics of a standard unit for calibration and measurements of the standard unit obtained through use of a measuring apparatus thereby lessening the measurement error of the measuring apparatus regardless of the shape of an object to be measured. SOLUTION: An SMD measuring jig 20 and a measuring cable 30 are connected in place of a measuring jig 60 dedicated for a standard unit. The SMD measuring jig 20 is set with a standard unit 70 for calibration and S parameters of the standard unit 70 are acquired over a specified frequency range. The acquired data is transferred, as a measurement data, to a computer 50. The computer 50 calculates a correction data based on an actual characteristic data of the standard unit 70, and a measurement data containing the error of a measuring system comprising the SMD measuring jig 20 and the measuring cable. The correction data is transferred to a measuring apparatus 10 and set therein as a calibration data thus completing calibration of the measuring apparatus 10.
申请公布号 JP2000275315(A) 申请公布日期 2000.10.06
申请号 JP19990077124 申请日期 1999.03.23
申请人 TAIYO YUDEN CO LTD 发明人 IMAIZUMI TATSUYA;SHIMAKATA YUKIHIRO;TAKAHASHI SEISHIN
分类号 G01D18/00;G01R35/00;(IPC1-7):G01R35/00 主分类号 G01D18/00
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