发明名称 LOGIC CIRCUIT AND PROCESSOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a small-scale circuit for inspecting that only one signal line among N signal lines is in a drive state. SOLUTION: An inspection unit 10, which comprises a 1st inspection part 11 which inspects that at least one signal line among N signal lines, is in a drive state, and a 2nd inspection part 12 which inspects that two or more signal lines among N signal lines are not in drive states outputs the results of previous inspections which are inputted from CHECK-1-IN' and CHECK-2-IN' and the results of inspections, to which new signal line information data inputted by DATAi are added. N such inspection units 10 are connected to each other to form a chain. Furthermore, in a reconfigurable processor, floating and conflict of buses are tested by the inspection circuit to generate exceptions, when errors are detected.
申请公布号 JP2000277692(A) 申请公布日期 2000.10.06
申请号 JP19990082472 申请日期 1999.03.25
申请人 TOSHIBA CORP 发明人 TOKUMASU MOTOKI;FUJII HIROSHIGE
分类号 H01L21/822;H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L21/822
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