发明名称 PROBE DEVICE
摘要 PROBLEM TO BE SOLVED: To achieve good contact even if the needle tip of a contact pin has dispersion in height and to make a needle trace formed on an inspection object constant. SOLUTION: An electrostrictive actuator A is fitted to a unit contact probe 12. The electrostrictive actuator A is arranged near a contact pin 15a. When a voltage is applied to the electrostrictive actuator A after a fixed quantity of overdrive is applied to the contact pin 15a, the end section of the unit contact probe 12 is deflected to an inspection object side, thus the needle pressure can be increased. When a DC pulse wave or an AC voltage is applied to the electrostrictive actuator A, the unit contact probe 12 can be vibrated, a scrubbing property is improved, and dust, dirt and needle tip deposits can be removed.
申请公布号 JP2000275275(A) 申请公布日期 2000.10.06
申请号 JP19990082595 申请日期 1999.03.25
申请人 MITSUBISHI MATERIALS CORP 发明人 FUJIMORI SHUJI;SUGIYAMA TATSUO;YOSHIDA HIDEAKI
分类号 G01R1/06;G01R1/073;G01R31/28;H01L21/66;(IPC1-7):G01R1/073 主分类号 G01R1/06
代理机构 代理人
主权项
地址