发明名称 ATOMIC ABSORPTION ANALYSIS METHOD AND APPARATUS
摘要 PROBLEM TO BE SOLVED: To hold conventional characteristics of an atomic absorption method while expanding a measuring concn. range by irradiating the atomic layer of a sample with laser beam with a specific wavelength and measuring the presence amt. of an element to be analyzed in the sample from the attenuation quantity of the intensity of the transmitted laser beam. SOLUTION: The beam emitted from a wavelength variable laser 1 is converted to beam with a proper diameter by an incident optical system 2 and this beam passes through the atomic vapor layer 4 formed in an atomizing part 3 to transmit through a spectroscope or optical filter 6 through a photometric optical system 5 and the intensity thereof is measured by an intensity-of-light detector 7 such as a photomultiplier. At this time, the wavelength of the wavelength variable laser 1 is set to that of laser beam with a wavelength half value width of 0.001-0.002 nm wherein an output wavelength is adjusted to the center position±0.001 nm of an element to be analyzed entered in literature to be known and this wavelength beam is absorbed by the atomic vapor layer 4. On the basis of the relation between the absorption quantity and concn. of a sample with known concn., the concn. of the sample is calculated from the absorption quantity of the sample to be analyzed. By this constitution, the narrowness of a measuring concn. range being a defect of an atomic absorption method is eliminated.
申请公布号 JP2000275172(A) 申请公布日期 2000.10.06
申请号 JP19990079631 申请日期 1999.03.24
申请人 NKK CORP 发明人 AKIYOSHI TAKANORI;CHINO ATSUSHI;SUGIMOTO KAZUMASA;ISHIDA TOMOHARU
分类号 G01N1/28;G01N21/31;(IPC1-7):G01N21/31 主分类号 G01N1/28
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