发明名称 Laser regulation circuit function testing circuit
摘要 The testing circuit has a low-ohmic resistor (R1) connected between the laser diode supply point and earth during the test mode, with a feedback voltage amplifier (T1,R2) connected in parallel with the low-ohmic resistor, its output coupled to the positive input of a transimpedance amplifier (TIV) within the laser regulation circuit. The positive input of the transimpedance amplifier is coupled via a resistor (R3) and a parallel capacitor (C2) to a reference potential, the laser diode supply point coupled to an oscilloscope via a further resistor (R5).
申请公布号 DE19913373(A1) 申请公布日期 2000.10.05
申请号 DE19991013373 申请日期 1999.03.24
申请人 SIEMENS AG 发明人 LASSER, OTHMAR
分类号 G01R31/28;H01S5/068;H01S5/0683;(IPC1-7):H01S5/062 主分类号 G01R31/28
代理机构 代理人
主权项
地址