发明名称 MEASUREMENT SYSTEM UTILIZING A SENSOR FORMED ON A SILICON ON INSULATOR STRUCTURE
摘要 <p>A measurement system utilizes a sensor formed in a semiconductor on insulator structure that has an offset related to the time that power is applied. A controller applies power, obtains readings and removes power so as to minimize any effect of the offset.</p>
申请公布号 WO2000058692(A1) 申请公布日期 2000.10.05
申请号 US2000005733 申请日期 2000.03.03
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