发明名称 A REACTIVE ION ETCHING PROCESS
摘要 <p>A reactive ion etching process controls the flow rate of at least one etchant gas used in said reactive ion etching process, the pressure of said at least one etchant gas; and the r.f. power used in said reactive ion etching process. The parameters of flow rate, pressure and r.f. power are selected to obtain a desired etch rate and/or a desired level of material re-deposition in the reactive ion etching process.</p>
申请公布号 WO2000059020(A1) 申请公布日期 2000.10.05
申请号 GB2000001231 申请日期 2000.03.30
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