发明名称 |
MOS-Transistorstruktur mit einer Trench-Gate-Elektrode und einem verringerten spezifischen Einschaltwiderstand und Verfahren zur Herstellung einer MOS-Transistorstruktur |
摘要 |
The invention relates to an MOS transistor structure with a trench gate electrode and a reduced specific closing resistor. The integral of the doping concentration of the body region in the lateral direction between two adjacent drift regions is greater than or equal to the integral of the doping concentration in a drift region in the same lateral direction. The invention also relates to methods for producing an MOS transistor structure. Body regions and drift regions are produced by means of epitaxic growth and implantation, repeated epitaxic growth or by filling trenches with doped conduction material.
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申请公布号 |
DE19913375(A1) |
申请公布日期 |
2000.10.05 |
申请号 |
DE19991013375 |
申请日期 |
1999.03.24 |
申请人 |
SIEMENS AG |
发明人 |
HIRLER, FRANZ;WERNER, WOLFGANG |
分类号 |
H01L21/336;H01L29/06;H01L29/10;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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