发明名称 |
Atomic force microscope with optional replaceable fluid cell. |
摘要 |
<p>An atomic force microscope which is readily useable for researchers for its intended use without extensive lost time for setup and repair. The probe (10,20) used therein is a cantilevered optical lever which imparts surface information in a gentle and reliable manner by reflecting an incident laser beam (24). The probe is carried by a replaceable probe-carrying module (48) which is factory set up and merely inserted and fine tuned by the user. The probe-carrying module also includes the provision for forming a fluid cell (124) around the probe. Fluid can be inserted into and/or be circulated through the fluid cell through incorporated tubes (126,128) in the probe-carrying module. Electrodes (164) are also provided in the fluid cell for various uses including real-time studies of electro-chemical operations taking place in the fluid cell. The piezoelectric scan tube (32) employed includes a voltage shield (60) to prevent scanning voltages to the tube from affecting data readings. Samples (14) are easily mounted, replaced, and horizontally adjusted using a sample stage (58) which is magnetically attached to the top of the scan tube. Calibration tools are provided to make initial set up and fine tuning of the microscope a simple and straightforward operation requiring little or no technical talent.</p> |
申请公布号 |
EP0862045(A3) |
申请公布日期 |
2000.10.04 |
申请号 |
EP19980201015 |
申请日期 |
1990.02.16 |
申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
发明人 |
HANSMA, PAUL K.;DRAKE, BARNEY |
分类号 |
G01B7/34;B01L7/00;G01B11/24;G01B21/30;G01L5/00;G01N21/88;G01N37/00;G01Q30/02;G01Q30/14;G01Q60/00;G01Q60/24;G01Q60/38;G01Q70/02;G01Q70/04;H01J37/20;(IPC1-7):G01B7/34 |
主分类号 |
G01B7/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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