发明名称 Automatic location determination of devices under test
摘要 A test device for a computer system includes a burn rack having a plurality of workcells. A simple network management protocol switch device is provided adjacent the burn rack. The switch device includes a plurality of ports. A plurality of cables are provided such that a respective cable interconnects a respective port of the switch device and a respective workcell. A monitor is provided adjacent the burn rack and is connected to a port of the switch device. At least one of the workcells has a computer mounted therein provided with a unique Mac Address and connected to the respective cable at the respective workcell. The monitor is connected to a burn rack database.
申请公布号 GB2343766(B) 申请公布日期 2000.10.04
申请号 GB19990018882 申请日期 1999.08.10
申请人 * DELL USA, L.P. 发明人 SUBHASHINI * RAJAN;ROGER W * WONG
分类号 G06F11/24;G01R31/00;G01R31/26;G06F11/22;G06F11/273;(IPC1-7):G06F11/00;G06F17/60 主分类号 G06F11/24
代理机构 代理人
主权项
地址