发明名称 Semiconductor device with a reduced width gate dielectric and method of making same
摘要 The present invention is directed to a semiconductor device having a reduced feature size and a method of making same. The device is comprised of a gate dielectric positioned above a semiconducting substrate, and a gate conductor positioned above said gate dielectric. The width of the gate dielectric being less than the width of the gate conductor. The device further comprises a plurality of sidewall spacers adjacent said conductor. The method is comprised of forming a gate dielectric above the surface of a semiconducting substrate, forming a gate conductor above the gate dielectric, and wet etching the gate dielectric to a finished width that is less than the width of the gate conductor.
申请公布号 US6127251(A) 申请公布日期 2000.10.03
申请号 US19980149398 申请日期 1998.09.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 GARDENER, MARK I.;HAUSE, FREDERICK N.;MAY, CHARLES E.
分类号 H01L21/28;H01L21/336;H01L29/423;H01L29/51;(IPC1-7):H01L21/320;H01L21/476 主分类号 H01L21/28
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